Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics-Reference-Cited by-同舟云学术

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Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics

Published:2024-02 Issue:2 Volume:71 Page:1131-1138
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Zenari Michele¹^ORCID,Buffolo Matteo¹^ORCID,De Santi Carlo¹^ORCID,Goyvaerts Jeroen²,Grabowski Alexander³^ORCID,Gustavsson Johan³,Baets Roel⁴^ORCID,Larsson Anders³^ORCID,Roelkens Günther⁴^ORCID,Meneghesso Gaudenzio¹^ORCID,Zanoni Enrico¹^ORCID,Meneghini Matteo⁵^ORCID

Affiliation:

1. Department of Information Engineering, University of Padua, Padua, Italy

2. LIGENTEC SA, Ecublens, Switzerland

3. Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden

4. Photonics Research Group, Ghent University-imec, Ghent, Belgium

5. Department of Information Engineering and the Department of Physics and Astronomy, University of Padua, Padua, Italy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/10413236/10380419.pdf?arnumber=10380419

Reference33 articles.

1. 2022 Roadmap on integrated quantum photonics

2. Silicon photonics for telecom and data-com applications

3. Silicon Photonics Sensors for Biophotonic Applications—A Review

4. A Review of Silicon Photonics LiDAR

5. Silicon photonic terabit/s network-on-chip for datacenter interconnection

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