New Power Clamp Circuit for Concurrent ESD and Surge Protections-Reference-Cited by-同舟云学术

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New Power Clamp Circuit for Concurrent ESD and Surge Protections

Published:2023-09 Issue:9 Volume:70 Page:4538-4546
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Yang Zhaonian¹^ORCID,Xu Jinghao¹^ORCID,Fu Dongbing²,Zhang Yan³^ORCID,Zhang Yue¹,Yang Yuan¹^ORCID,Yu Ningmei¹

Affiliation:

1. Shaanxi Key Laboratory of Complex System Control and Intelligent Information Processing, Xi’an University of Technology, Xi’an, China

2. Chongqing Gigachip Technology Company Ltd., Chongqing, China

3. School of Telecommunications Engineering, Xidian University, Xi’an, China

Funder

National Natural Science Foundation of China

Shaanxi innovation capability support project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/10227840/10214171.pdf?arnumber=10214171

Reference23 articles.

1. TLP characterization for testing system level ESD performance;jahanzeb;Proc EOS/ESD Symp,2010

2. Rail Clamp with Dynamic Time-Constant Adjustment

3. Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps;ruth;Proc EOS/ESD Symp,2013

4. Power-Rail ESD Clamp Circuit With Diode-String ESD Detection to Overcome the Gate Leakage Current in a 40-nm CMOS Process

5. Novel Active ESD Clamps for High-Voltage Applications

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