Process-Voltage-Temperature Variability Estimation of Tunneling Current for Band-to-Band-Tunneling-Based Neuron-Reference-Cited by-同舟云学术

Process-Voltage-Temperature Variability Estimation of Tunneling Current for Band-to-Band-Tunneling-Based Neuron

Published:2024-01 Issue:1 Volume:71 Page:752-758
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Patil Shubham¹^ORCID,Sharma Anand¹^ORCID,Gaurav R.¹^ORCID,Kadam Abhishek¹^ORCID,Singh Ajay Kumar¹^ORCID,Lashkare Sandip¹^ORCID,Mohapatra Nihar Ranjan²^ORCID,Ganguly Udayan¹^ORCID

Affiliation:

1. Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India

2. Department of Electrical Engineering, Indian Institute of Technology Gandhinagar, Gandhinagar, Gujarat, India

Funder

Department of Science and Technology (DST), India

Indian Institute of Technology Bombay Nano-Fabrication (IITBNF) Facility IIT Bombay

Centre for Excellence (CEN), IIT Bombay

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/10382412/10338830.pdf?arnumber=10338830

Reference36 articles.

1. Resistive-RAM-Based In-Memory Computing for Neural Network: A Review

2. Parallel, distributed and GPU computing technologies in single-particle electron microscopy

3. Routing brain traffic through the von Neumann bottleneck: Efficient cache usage in spiking neural network simulation code on general purpose computers

4. Beyond von Neumann

5. Neuromorphic Brain-Inspired Computing with Hybrid Neural Networks

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