A One-Point Trimmed 0.14-mK-Resolution Temperature Sensor Based on Improved Dynamic Element Matching Techniques
Author:
Affiliation:
1. Shanghaitech University,School of Information Science and Technology,Shanghai,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10011216/10011228/10011329.pdf?arnumber=10011329
Reference10 articles.
1. Design and realization of a voltage detector based on current comparison in a 40nm technology
2. Bitstream trimming of a smart temperature sensor;pertijs;SENSORS,2004
3. A BJT-Based CMOS Temperature Sensor With Duty-Cycle-Modulated Output and ±0.5°C (3σ) Inaccuracy From −40 °C to 125 °C
4. Modeling sigma-delta modulator non-idealities in SIMULINK(R)
5. Dynamic element matching for high-accuracy monolithic D/A converters
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