In-house Test Wafer Reclaim for Fab Cost and Wastage Reduction: MS: Manufacturing for Sustainability-Reference-Cited by-同舟云学术

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In-house Test Wafer Reclaim for Fab Cost and Wastage Reduction: MS: Manufacturing for Sustainability

Published:2024-05-13 Issue: Volume: Page:1-7
ISSN:
Container-title:2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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Author:

Dong Xinqiao¹,Mukherjee Subhadeep¹,Asokan Monicka¹,Yang Yi¹,Duvvuru Vivek¹

Affiliation:

1. Micron Technology Inc.,Manassas,VA,USA,20110

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10545359/10545360/10545463.pdf?arnumber=10545463

Reference5 articles.

1. Implementation of a Test Wafer Inventory Tracking System to Increase Efficiency in Monitor Wafer Usage;Sandy,1997

2. In-house Test Wafer Reclaim and PMON Recycle for Cost Reduction;Dong;Micron-TLP Journal - Manufacturing,2019

3. A Net Zero Plan for the Semiconductor Industry;Tembey;BCG analysis of data from CDP, imec, SEMI, and IEA,2024

4. Reclaim wafer defect classification using Large-scale BPNs with TensorFlow;Tien,1997

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