Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models-Reference-Cited by-同舟云学术

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Using Pre-Release Test Failures to Build Early Post-Release Defect Prediction Models

Published:2014-11 Issue: Volume: Page:
ISSN:
Container-title:2014 IEEE 25th International Symposium on Software Reliability Engineering
language:
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Author:

Herzig Kim

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6982003/6982338/06982636.pdf?arnumber=6982636

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TraceJIT: Evaluating the Impact of Behavioral Code Change on Just-In-Time Defect Prediction;2024 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER);2024-03-12

2. Towards an understanding of intra-defect associations: Implications for defect prediction;Journal of Systems and Software;2024-01

3. Studying the effectiveness of deep active learning in software defect prediction;International Journal of Computers and Applications;2023-08-03

4. DeepLineDP: Towards a Deep Learning Approach for Line-Level Defect Prediction;IEEE Transactions on Software Engineering;2023-01-01

5. Bayesian Meta-Analysis of Software Defect Prediction With Machine Learning;IEEE Transactions on Industrial Cyber-Physical Systems;2023

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