Author:
Eggersgluss Stephan,Holst Stefan,Tille Daniel,Miyase Kohei,Wen Xiaoqing
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Functional Compaction for Functional Test Sequences;IEEE Access;2024
2. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
3. Next Generation Design For Testability, Debug and Reliability Using Formal Techniques;2022 IEEE International Test Conference (ITC);2022-09
4. Formal Techniques;Design for Testability, Debug and Reliability;2021
5. Reverse Low-Power Broadside Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-03