Research on Classification of Cement-based Electron Microscope Images Based on Improved Residual Network-Reference-Cited by-同舟云学术

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Research on Classification of Cement-based Electron Microscope Images Based on Improved Residual Network

Published:2022-02-22 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 16th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)
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Author:

Liu Wei¹,Wu Xuguang²,Wang Yingbin³,Ye Zhiwei²,Li Pan²,Kochan Orest⁴

Affiliation:

1. School of Computer Science Hubei University of Technology,Wuhan,China

2. School of Computer Hubei University of Technology,Wuhan,China

3. School of Civil Engineering Hubei University of Technology,Wuhan,China

4. Hubei University of Technology,Wuhan,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9766439/9766835/09766970.pdf?arnumber=9766970

Reference17 articles.

1. Squeeze-and-Excitation Networks

2. CBAM: Convolutional Block Attention Module;woo;Proc of European conference on computer vision (ECCV 2018),0

3. Multi-Segment Foot Modeling for Human Animation

4. RNN / LSTM with modified Adam optimizer in deep learning approach for automobile spare parts demand forecasting

5. Data science applications to improve accuracy of thermocouples

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pedestrain Detection Based on Improved CSP Network;2023 17th International Conference on the Experience of Designing and Application of CAD Systems (CADSM);2023-02-22

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