Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics-Reference-Cited by-同舟云学术

Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics

Published:2022-01-17 Issue: Volume: Page:
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Container-title:2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)
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Author:

Huang Junhua¹,Zhen Hui-Ling²,Wang Naixing³,Yuan Mingxuan²,Mao Hui²,Huang Yu³,Tao Jiping¹

Affiliation:

1. Xiamen University

2. Noah's Ark Lab,Huawei

3. Hisilicon,Huawei

Publisher

IEEE

Link

Reference27 articles.

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4. Tiguan: Thread-parallel integrated test pattern generator utilizing satisfiability analysis;polian;International Conference on VLSI Design,2009

5. Passat: Efficient sat-based test pattern generation for industrial circuits;shi;IEEE Annual Symposium on VLSI,2005

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