Analysis of the effects of scaling on interconnect delay in ULSI circuits-Reference-Cited by-同舟云学术

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Analysis of the effects of scaling on interconnect delay in ULSI circuits

Published:1993-03 Issue:3 Volume:40 Page:591-597
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Bothra S.,Rogers B.,Kellam M.,Osburn C.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/5182/00199365.pdf?arnumber=199365

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