Thermal near-field spectroscopic analysis on dielectrics
Author:
Affiliation:
1. The University of Tokyo,Tokyo,JAPAN,1538505
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10298848/10298849/10299361.pdf?arnumber=10299361
Reference6 articles.
1. Nanoscale probing of thermally excited evanescent fields in an electrically biased graphene by near-field optical microscopy
2. Tip size dependence of passive near-field microscopy
3. Passive near-field imaging via grating-based spectroscopy
4. Piezoelectric tip‐sample distance control for near field optical microscopes
5. Charge-sensitive infrared phototransistors: Characterization by an all-cryogenic spectrometer
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