Progress in process development of La0.7Sr0.3MnO3 thin films for uncooled THz bolometers-Reference-Cited by-同舟云学术

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Progress in process development of La_0.7Sr_0.3MnO₃ thin films for uncooled THz bolometers

Published:2023-09-17 Issue: Volume: Page:
ISSN:
Container-title:2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
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Author:

Quinten T.¹,Lechaux Y.¹,Pierron V.¹,Gunther C.¹,Méchin L.¹,Lampin J.-F.²,Faucher M.²,Walter B.³,Guillet B.¹

Affiliation:

1. Normandie Univ,UNICAEN, ENSICAEN, CNRS, GREYC,Caen,France,14000

2. UMR CNRS 8520, Univ. Lille,Institut d’Electronique de Microélectronique et de Nanotechnologie (IEMN),Villeneuve d’Ascq,France,59652

3. Vmicro SAS, Avenue Poincaré,Villeneuve d’Ascq,France,59650

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10298848/10298849/10299059.pdf?arnumber=10299059

Reference6 articles.

1. Electro-thermal and optical characterization of an uncooled suspended bolometer based on an epitaxial La0.7Sr0.3MnO3 film grown on CaTiO3/Si

2. Free-standing La0.7Sr0.3MnO3 suspended micro-bridges on buffered silicon substrates showing undegraded low frequency noise properties

3. On-wafer RF high-power measurement with an LSMO load at 40 GHz;quinten;submitted to IRmmwTHz,2023

4. Impedance measurements in La_0.7Sr_0.3MnO₃ thin films for uncooled THz bolometers

5. Experimental evidence of correlation between 1/fnoise level and metal-to-insulator transition temperature in epitaxial La0.7Sr0.3MnO3thin films

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