Fast Coupled Thermoelectric and Magnetic Model to Simulate the Transient Behavior of Inductive and Resistive Superconducting Fault-Current Limiters-Reference-Cited by-同舟云学术

Fast Coupled Thermoelectric and Magnetic Model to Simulate the Transient Behavior of Inductive and Resistive Superconducting Fault-Current Limiters

Author:

Santos Gabriel dos¹^ORCID,Trillaud Frederic²^ORCID,Santos Bárbara Maria Oliveira¹^ORCID,Sass Felipe³^ORCID,Sotelo Guilherme Gonçalves³^ORCID

Affiliation:

1. Department of Electrical Engineering, State University of Rio de Janeiro, Rio de Janeiro, Brazil

2. Instituto de Ingeniería, Universidad Nacional Autónoma de México, Ciudad de México, Mexico

3. Department of Electrical and Electronic Engineering, Federal Fluminense University of Rio de Janeiro, Niterói, Brazil

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

Reference38 articles.

2. An efficient 3D finite element method model based on the T–A formulation for superconducting coated conductors;zhang;Supercond Sci Technol,2016

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