Investigation of the Critical Currents in Thin-Film MoGe Devices-Reference-Cited by-同舟云学术

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Investigation of the Critical Currents in Thin-Film MoGe Devices

Published:2024-05 Issue:3 Volume:34 Page:1-4
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Nevirkovets Ivan P.¹^ORCID,Grudichak Scott T.¹^ORCID,Belogolovskii Mikhail²^ORCID,Ketterson John B.³^ORCID

Affiliation:

1. Department of Physics and Astronomy, Northwestern University, Evanston, IL, USA

2. Department of Experimental Physics, Faculty of Mathematics, Physics and Informatics, Comenius University Bratislava, Bratislava, Slovakia

3. Department of Physics and Astronomy and the Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, USA

Funder

EU NextGenerationEU

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://ieeexplore.ieee.org/ielam/77/10339679/10367811-aam.pdf

Reference11 articles.

1. Quantum interference and confinement phenomena in mesoscopic superconducting systems

2. Vortices in high-temperature superconductors

3. The flux-line lattice in superconductors

4. Observation of a new universal resistive behavior of two-dimensional superconductors in a magnetic field

5. Evaluating free flux flow in low-pinning molybdenum-germanium superconducting films

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