Probing Intercalated Indium-Tin Oxide Films by Non-Local Resistance Measurements

Author:

Parra Aaron1ORCID,Aliev Ali1ORCID,Belogolovskii Mikhail2ORCID,Zhitlukhina Elena2ORCID,Poláčková Magdaléna2ORCID,Gregor Maroš2ORCID,Plecenik Tomáš2ORCID

Affiliation:

1. Alan G. MacDiarmid NanoTech Institute, University of Texas at Dallas, Richardson, TX, USA

2. Department of Experimental Physics, Faculty of Mathematics, Physics and Informatics, Comenius University Bratislava, Bratislava, Slovakia

Funder

EU NextGenerationEU

Recovery and Resilience Plan for Slovakia

Agentúra na Podporu Výskumu a Vývoja

Operational Program Integrated Infrastructure for the Projects Advancing University Capacity and Competence in Research

Development and Innovation

UpScale of Comenius University Capacities and Competence in Research

European Regional Development Fund

NATO Science for Peace and Security Programme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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