Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)-Reference-Cited by-同舟云学术

Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)

Published:2007-12 Issue:12 Volume:28 Page:1129-1131
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Cho Keun Hwi,Suk Sung Dae,Yeoh Yun Young,Li Ming,Yeo Kyoung Hwan,Kim Dong-Won,Park Donggun,Lee Won-Seong,Jung Young Chai,Hong Byung Hak,Hwang Sung Woo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/4383529/04383534.pdf?arnumber=4383534

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