Power efficient charge pump in deep submicron standard cmos technology-Reference-Cited by-同舟云学术

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Power efficient charge pump in deep submicron standard cmos technology

Published:2003-06 Issue:6 Volume:38 Page:1068-1071
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Pelliconi R.,Iezzi D.,Baroni A.,Pasotti M.,Rolandi P.L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/27070/01202012.pdf?arnumber=1202012

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