ESD protection design for I/O cells with embedded SCR structure as power-rail ESD clamp device in nanoscale CMOS technology-Reference-Cited by-同舟云学术

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ESD protection design for I/O cells with embedded SCR structure as power-rail ESD clamp device in nanoscale CMOS technology

Published:2005-11 Issue:11 Volume:40 Page:2329-2338
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Ming-Dou Ker ,Lin K.-H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/32564/01522573.pdf?arnumber=1522573

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast and Accurate post-layout simulation methodology using 4nm LVS rule deck;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23

2. Robust HV Power pLDMOS Components for ESD Protection by the Drain-side Parasitic Schottky Diode and SCR Engineering;2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia);2022-05-15

3. Enhance the ESD Ability of UHV 300-V Circular LDMOS Components by Embedded SCRs and the Robustness P-Body Well;IEEE Journal of the Electron Devices Society;2021

4. Design of embedded SCR device to improve ESD robustness of stacked-device output driver in low-voltage CMOS technology;Solid-State Electronics;2016-10

5. Improving ESD Robustness of pMOS Device With Embedded SCR in 28-nm High- $k$ /Metal Gate CMOS Process;IEEE Transactions on Electron Devices;2015-04

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