On the development of intelligent optical inspections-Reference-Cited by-同舟云学术

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On the development of intelligent optical inspections

Published:2017-01 Issue: Volume: Page:
ISSN:
Container-title:2017 IEEE 7th Annual Computing and Communication Workshop and Conference (CCWC)
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Author:

Richter Johannes,Streitferdt Detlef,Rozova Elena

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7864800/7868337/07868455.pdf?arnumber=7868455

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Multi-illumination Imaging System with CNN Machine Learning Applied to Optical Inspection of Highly Complex Specimen;2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2023-05-22

5. A Study on Deep Learning Methods in the Concept of Industry 4.0;Applied AI and Multimedia Technologies for Smart Manufacturing and CPS Applications;2023-01-06

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