Author:
Huang Po-Chin,Chen Jone F.,Tsai Shih Chang,Wu San Lein,Tsai Kai-Shiang,Kao Tsung Hsien,Fang Yean-Kuen,Lai Chien-Ming,Hsu Chia-Wei,Chen Yi-Wen,Cheng Osbert
Funder
Ministry of Science and Technology, Taiwan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
2. Impact device processing and scaling on RTS;Random Telegraph Signals in Semiconductor Devices;2017