Author:
DeMillo R.A.,Lipton R.J.,Sayward F.G.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
1106 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Decomposition of Deep Neural Networks into Modules via Mutation Analysis;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11
2. FeatMaker: Automated Feature Engineering for Search Strategy of Symbolic Execution;Proceedings of the ACM on Software Engineering;2024-07-12
3. Java JIT Testing with Template Extraction;Proceedings of the ACM on Software Engineering;2024-07-12
4. Syntax Is All You Need: A Universal-Language Approach to Mutant Generation;Proceedings of the ACM on Software Engineering;2024-07-12
5. Mutation Testing for Task-Oriented Chatbots;Proceedings of the 28th International Conference on Evaluation and Assessment in Software Engineering;2024-06-18