Reversable Logic Gates Based Linear Block Codes For Multiple Adjacent Bits Error Correction-Reference-Cited by-同舟云学术

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Reversable Logic Gates Based Linear Block Codes For Multiple Adjacent Bits Error Correction

Published:2023-12-14 Issue: Volume: Page:1-6
ISSN:
Container-title:2023 International Conference on Next Generation Electronics (NEleX)
language:
Short-container-title:

Author:

Sri Y. Vishwa¹,Bernatin T.²

Affiliation:

1. Sathyabama Institute of Science and Technology (Deemed to be university),Department of Electronics and Communication Engineering,Chennai,Tamil Nadu,India

2. School of EEE Sathyabama Institute of Science and Technology (Deemed to be university),Chennai,Tamil Nadu,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10420829/10420849/10421141.pdf?arnumber=10421141

Reference20 articles.

1. Quantum dot Cellular Automata based Fault Tolerant Fingerprint Authentication Systems using Reversible Logic Gates

2. Lightweight PUF-Based Gate Replacement Technique to Reduce Leakage of Information through Power Profile Analysis

3. Multiple stimuli-switchable electrocatalysis and logic gates of l-cysteine based on P(DEA–co-VPBA) hydrogel films

4. Lightweight PUF-Based Gate Replacement Technique to Reduce Leakage of Information through Power Profile Analysis

5. Design and analysis of all-optical nibble multiplexer with tri-stated outputs using micro-ring resonator structure

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