A Framework System for Plant Leaf Disease Detection using K-Nearest Neighbours and comparison of its features with Naive Bayes Classification
Author:
Affiliation:
1. Saveetha University,Saveetha School of Engineering,Department of Computer Science and Engineering,Chennai,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9758922/9758923/09758924.pdf?arnumber=9758924
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