Affiliation:
1. Department of Electronic Systems Engineering, Indian Institute of Science, Bengaluru, India
Funder
Indian Institute of Science, Bangalore
Department of Science and Technology, Government of India, through the Technology Development Transfer Scheme
Science and Engineering Research Board
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Review of Degradation in GaN Based HEMTs;2024 9th International Conference on Electronic Technology and Information Science (ICETIS);2024-05-17
2. Experimental Insights into the Role of Inter-valley and Defect Transitions of Hot Electrons in Determining Self-heating in AlGaN/GaN HEMTs;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14