Author:
Boeuf F.,Arnaud F.,Boccaccio C.,Salvetti F.,Todeschini J.,Pain L.,Jurdit M.,Manakli S.,Icard B.,Planes N.,Gierczynski N.,Denorme S.,Borot B.,Ortolland C.,Duriez B.,Tavel B.,Gouraud P.,Broekaart M.,Dejonghe V.,Brun P.,Guyader F.,Morin P.,Reddy C.,Aminpur M.,Laviron C.,Smith S.,Jacquemin J.P.,Mellier M.,Andre F.,Bicais-Lepinay N.,Jullian S.,Bustos J.,Skotnicki T.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. 2-Port SRAM Bitcell Design;Robust SRAM Designs and Analysis;2012-04-09
2. Measurement and optimization of electrical process window;Journal of Micro/Nanolithography, MEMS, and MOEMS;2011-01-01