Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx5/19/4812252/04757266.pdf?arnumber=4757266
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2. Increasing the Solar Reliability Factor of a Dual-Axis Solar Tracker Using an Improved Online Built-In Self-Test Architecture;IEEE Access;2024
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5. Challenges for Semiconductor Test Engineering: A Review Paper;Journal of Electronic Testing;2012-01-26
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