Characterization of Single-Frequency Yb:$ \hbox{KYF}_{4}$ Lasers at 1.03 $\mu\hbox{m}$ for Optical Frequency Metrology-Reference-Cited by-同舟云学术

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Characterization of Single-Frequency Yb:$ \hbox{KYF}_{4}$ Lasers at 1.03 $\mu\hbox{m}$ for Optical Frequency Metrology

Published:2008-08 Issue:8 Volume:57 Page:1713-1717
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Pesatori A.,Galzerano G.,Norgia M.,Sani E.,Bonelli L.,Toncelli A.,Tonelli M.,Laporta P.,Svelto C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/4567685/04539640.pdf?arnumber=4539640

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An efficient low-noise single-frequency 1033 nm Yb3+-doped MOPA phosphate fiber laser system;Journal of Optics;2017-04-26

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