Author:
Kobashi Jumpei,Yamane Satoshi,Takeshita Atsushi
Cited by
3 articles.
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1. Integrating pattern matching and abstract interpretation for verifying cautions of microcontrollers;Software Testing, Verification and Reliability;2021-08-19
2. Model Checking of Real-Time Properties for Embedded Assembly Program Using Real-Time Temporal Logic RTCTL and Its Application to Real Microcontroller Software;IEICE Transactions on Information and Systems;2020-04-01
3. SMT-Based Bounded Model Checking of Embedded Assembly Program with Interruptions;2019 IEEE Intl Conf on Dependable, Autonomic and Secure Computing, Intl Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and Big Data Computing, Intl Conf on Cyber Science and Technology Congress (DASC/PiCom/CBDCom/CyberSciTech);2019-08