Stress induced change in hole concentration in superlattice films of bismuth-based oxide superconductors
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Published:1999-06
Issue:2
Volume:9
Page:2422-2425
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ISSN:1051-8223
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Container-title:IEEE Transactions on Appiled Superconductivity
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language:
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Short-container-title:IEEE Trans. Appl. Supercond.
Author:
Hatano T.,Labat S.,Ishii A.,Arisawa S.,Togano K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials