Board-level Functional Test Selection Based on Fault Tree Analysis-Reference-Cited by-同舟云学术

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Board-level Functional Test Selection Based on Fault Tree Analysis

Published:2023-06-23 Issue: Volume: Page:
ISSN:
Container-title:2023 6th International Symposium on Autonomous Systems (ISAS)
language:
Short-container-title:

Author:

Li Yaoyao¹,Wang Kangcheng²,Kang Yu³,Zhao Yunbo³,Bai Peng⁴

Affiliation:

1. AHU-IAI AI Joint Laboratory, Anhui University, Institute of Artificial Intelligence, Hefei Comprehensive National Science Center,Hefei,China

2. Institute of Artificial Intelligence, Hefei Comprehensive National Science Center,Hefei,China

3. USTC Institute of Advanced Technology, USTC Institute of Artificial Intelligence, Hefei Comprehensive National Science Center,Department of Automation,Hefei,China

4. USTC,Hefei,Department of Automation,China

Funder

National Natural Science Foundation of China

Research and Development

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10164121/10164123/10164562.pdf?arnumber=10164562

Reference14 articles.

1. New operators on triangular intuitionistic fuzzy numbers and their applications in system fault analysis

2. Using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly

3. Reliability study of motor controller in electric vehicle by the approach of fault tree analysis

4. Towards a Systematic Description of Fault Tree Analysis Studies Using Informetric Mapping

5. Black-Box Test-Cost Reduction Based on Bayesian Network Models

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