On-wafer calibration techniques for giga-hertz CMOS measurements-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

On-wafer calibration techniques for giga-hertz CMOS measurements

Published: Issue: Volume: Page:
ISSN:
Container-title:ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307)
language:
Short-container-title:

Author:

Kolding T.E.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6198/16541/00766225.pdf?arnumber=766225

Cited by 61 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modified Bisection Thru-Only Deembedding Algorithm for Long Test Fixtures;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. De-Embedding Technology for Active and Passive Device Testing Used in the Microwave and Terahertz Bands: A Review: An Overview of Different De-Embedding Techniques;IEEE Microwave Magazine;2024-03

3. A Mixed De-Embedding Method for On-Wafer Differential Devices Using One Line Standard;2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT);2023-05-14

4. Broadband Characterization of Thin Dielectrics Using Heterolayer and Monolayer MIM Capacitors;IEEE Transactions on Instrumentation and Measurement;2022

5. Investigations about Al and Cu-Based Planar Spiral Inductors on Sapphire for GaN-Based RF Applications;Applied Sciences;2021-06-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP