Author:
Wei Kang Huang ,Yi-Nan Shen ,Lombardi F.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
23 articles.
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1. Efficient Built in Self Repair for Multiple RAMs;2023 IEEE 8th International Conference for Convergence in Technology (I2CT);2023-04-07
2. Optimized counting threshold Built-in redundancy analysis for memories;Microprocessors and Microsystems;2021-03
3. Challenges and Solutions in Emerging Memory Testing;IEEE Transactions on Emerging Topics in Computing;2019-07-01
4. An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-03
5. Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-03