Image fusion and subpixel parameter estimation for automated optical inspection of electronic components-Reference-Cited by-同舟云学术

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Image fusion and subpixel parameter estimation for automated optical inspection of electronic components

Published:1996-06 Issue:3 Volume:43 Page:346-354
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Reed J.M.,Hutchinson S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx1/41/10857/00499806.pdf?arnumber=499806

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