Design of Optimal Length for Waveguide Offset Shorts in D-band based on Uncertainty Analysis
Author:
Affiliation:
1. Korea Research Institute of Standards and Science,Daejeon,South Korea
Funder
Korea Research Institute of Standards and Science
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10278504/10278621/10278873.pdf?arnumber=10278873
Reference12 articles.
1. Improvement of offset short calibration technique in waveguide VNA measurement at millimeter and sub-millimeter wave frequency
2. 500 GHz–750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
3. Uncertainty Analysis of Scattering Parameters Calibrated by an Electronic Calibration Unit Based on a Residual Model
4. Accuracy and Bandwidth Optimization of the Over-Determined Offset-Short Reflectometer Calibration
5. Establishing Traceability to the International System of Units for Scattering Parameter Measurements From 750 GHz to 1.1 THz
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty;IEEE Access;2024
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