Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models

Author:

Repasky Matthew1,Cheng Xiuyuan2,Xie Yao1

Affiliation:

1. Georgia Institute of Technology,H. Milton Stewart School of Industrial and Systems Engineering,Atlanta,GA,30332

2. Duke University,Department of Mathematics,Durham,NC,27708

Publisher

IEEE

Reference17 articles.

1. Generative adversarial nets;Goodfellow;Advances in neural information processing systems,2014

2. On integral probability metrics,\phi-divergences and binary classification;Sriperumbudur,2009

3. Measuring sample quality with stein’s method;Gorham;Advances in Neural Information Processing Systems,2015

4. A kernelized stein discrepancy for goodness-of-fit tests;Liu

5. Stein variational gradient descent: A general purpose bayesian inference algorithm;Liu;Advances in neural information processing systems,2016

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