Author:
Jain Suvi,Chaturvedi Nitin,Gurunarayanan S
Cited by
2 articles.
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1. ESD-capability Impacts of the RESURF NBL Length in High-voltage nLDMOSs;2023 9th International Conference on Applied System Innovation (ICASI);2023-04-21
2. Process Compensated Diagnostic Circuit For Impending Fault Detection In SRAM Write Drivers;2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS);2021-11-22