Analyzing The Image Augmentation to Find the Defect in Apple Leaf-Reference-Cited by-同舟云学术

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Analyzing The Image Augmentation to Find the Defect in Apple Leaf

Published:2023-11-23 Issue: Volume:6 Page:599-603
ISSN:
Container-title:2023 3rd International Conference on Advancement in Electronics & Communication Engineering (AECE)
language:
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Author:

Renuka K.¹,Veeresh U.¹,Varun T.¹,Polamuri Subba Rao²,Lingamaiah V.³

Affiliation:

1. CMR Institute of Technology,Department of CSE,Hyderabad,India

2. Bonam Venkata Chalamayya Engineering College (Autonomous),Department of CSE (Artificial Intelligence & Data Science),Odalarevu,India

3. Anurag University,Department of CSE,Hyderabad,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10428120/10428096/10428162.pdf?arnumber=10428162

Reference17 articles.

1. Disease Detection in Apple Leaves Using Deep Convolutional Neural Network

2. Real-Time Detection of Apple Leaf Diseases Using Deep Learning Approach Based on Improved Convolutional Neural Networks

3. On-tree fruit recognition using texture properties and color data

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1. Stroke detection in the brain using MRI and deep learning models;Multimedia Tools and Applications;2024-05-15

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