Two bayesian methods for junction classification
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx5/83/26951/01197837.pdf?arnumber=1197837
Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Distance‐based Method;Chemometrics and Numerical Methods in LIBS;2022-10-07
2. Field of Junctions: Extracting Boundary Structure at Low SNR;2021 IEEE/CVF International Conference on Computer Vision (ICCV);2021-10
3. PPGNet: Learning Point-Pair Graph for Line Segment Detection;2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR);2019-06
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