A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples-Reference-Cited by-同舟云学术

A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples

Author:

Wen Long¹^ORCID,Wang You¹^ORCID,Li Xinyu²^ORCID

Affiliation:

1. School of Mechanical Engineering and Electronic Information, China University of Geosciences, Wuhan, China

2. State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China

Funder

National Natural Science Foundation of China

Major Special Science and Technology Project of Hubei Province

State Key Lab of Digital Manufacturing Equipment and Technology

Huazhong University of Science and Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

Reference41 articles.

1. Unified generative adversarial networks for multi-domain image-to-image translation;choi;Proc IEEE Conf Comput Vis Pattern Recognit,2018

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