Author:
Barnhart C.,Brunkhorst V.,Distler F.,Farnsworth O.,Ferko A.,Keller B.,Scott D.,Koenemann B.,Onodera T.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
52 articles.
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1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. A Novel Test Data Compaction Method with Improved Debug Capabilities of the Signatures;2023 IEEE International Test Conference India (ITC India);2023-07-23
3. Compression-Aware ATPG;2022 IEEE International Test Conference (ITC);2022-09
4. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09
5. X-Masking for In-System Deterministic Test;2022 IEEE European Test Symposium (ETS);2022-05-23