Fabrication and wafer testing of barber-pole and exchange-biased narrow-track MR sensors-Reference-Cited by-同舟云学术

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Fabrication and wafer testing of barber-pole and exchange-biased narrow-track MR sensors

Published:1982-11 Issue:6 Volume:18 Page:1149-1151
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:en
Short-container-title:IEEE Trans. Magn.

Author:

Tsang C.,Fontana R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/20/22856/01061996.pdf?arnumber=1061996

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