Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
30 articles.
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1. Bayesian Analysis of Stochastic Processes in Reliability;Emerging Topics in Statistics and Biostatistics;2021-12-09
2. Modified signed log-likelihood ratio test for the scale parameter of the power-law process with applications to repairable systems;Communications in Statistics - Simulation and Computation;2021-09-23
3. Bayesian Modelling for Product Testing and Release;IFIP Advances in Information and Communication Technology;2020
4. Optimal allocation of test times for reliability growth testing with interval-valued model parameters;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2019-02-07
5. Implementation of Power Law Model for Assessing Software Reliability;Proceedings of the Second International Conference on Computational Intelligence and Informatics;2018