High-Resolution Millimeter-Wave Tomography System for Nondestructive Testing of Low-Permittivity Materials-Reference-Cited by-同舟云学术

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High-Resolution Millimeter-Wave Tomography System for Nondestructive Testing of Low-Permittivity Materials

Published:2021-01 Issue:1 Volume:69 Page:1105-1113
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Och Andreas^ORCID,Holzl Patrick A.,Schuster Stefan^ORCID,Scheiblhofer Stefan^ORCID,Zankl Dominik,Pathuri-Bhuvana Venkata,Weigel Robert^ORCID

Funder

Silicon Austria Labs

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9314312/09241450.pdf?arnumber=9241450

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