Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling-Reference-Cited by-同舟云学术

Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling

Published:2020-05 Issue:5 Volume:68 Page:1627-1636
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Martin-Guerrero Teresa M.^ORCID,Santarelli Alberto^ORCID,Gibiino Gian Piero^ORCID,Traverso Pier Andrea^ORCID,Camacho-Penalosa Carlos^ORCID,Filicori Fabio

Funder

Spanish Ministerio de Ciencia, Innovación y Universidades in the frame of Salvador de Madariaga Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9087921/09049109.pdf?arnumber=9049109

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