Thermal stability of MISFET with low-temp molecular-beam epitaxy-grown GaAs and Al/sub 0.3/Ga/sub 0.7/As gate ins
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Published:2000-06
Issue:2
Volume:49
Page:147-152
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ISSN:0018-9529
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Container-title:IEEE Transactions on Reliability
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language:
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Short-container-title:IEEE Trans. Rel.
Author:
Rao R.V.V.V.J.,Chong T.C.,Tan L.S.,Lau W.S.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality