A Model For Probabilistic Fault Propagation with the Approach of Effective Fanouts in the Logic Circuits-Reference-Cited by-同舟云学术

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A Model For Probabilistic Fault Propagation with the Approach of Effective Fanouts in the Logic Circuits

Published:2023-05-09 Issue: Volume: Page:
ISSN:
Container-title:2023 31st International Conference on Electrical Engineering (ICEE)
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Author:

Sartakhti Esfandiar Esmaieli¹,Sedaghat Yasser¹,Peiravi Ali²

Affiliation:

1. Ferdowsi University of Mashhad,Dependable Distributed Embedded Systems (DDEmS) Lab,Department of Electrical Engineering,Mashhad,Iran

2. Ferdowsi University of Mashhad,Department of Electrical Engineering,Mashhad,Iran

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10334618/10334629/10334701.pdf?arnumber=10334701

Reference22 articles.

1. Simulation-Based Method for Synthesizing Soft Error Tolerant Combinational Circuits

2. Reliability and radiation effects in IC technologies

3. Technology scaling and soft error reliability

4. Single-Event Transient Analysis in High Speed Circuits

5. An Incremental Algorithm for Soft Error Rate Estimation of Combinational Circuits

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Effective Fanout-Based Method for Improving Error Propagation Probability Estimation in Combinational Circuits;IEEE Access;2024

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