Author:
Hiblot Gaspard,Parihar Narendra,Dupuy Emmanuel,Mannaert Geert,Baudot Sylvain,Kaczer Ben,Heyn Vincent De,Mercha Abdelkarim
Cited by
1 articles.
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1. Antenna effect in 65nm NMOS devices with 9.5nm thick HfOx gate dielectric;2021 IEEE International Integrated Reliability Workshop (IIRW);2021-10-04