Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults-Reference-Cited by-同舟云学术

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Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults

Published:2009-05 Issue:5 Volume:56 Page:419-423
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Song Jaehoon,Han Juhee,Yi Hyunbean,Jung Taejin,Park Sungju

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/8920/4939458/04939466.pdf?arnumber=4939466

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detection of Crosstalk Faults in Digital Circuits by Testability Evaluation;Key Engineering Materials;2010-06

2. Test Method for Crosstalk Faults in VLSI Circuits Based on Multiple-Valued Decision Diagrams;Applied Mechanics and Materials;2010-01

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