Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm-Reference-Cited by-同舟云学术

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Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm

Published:2024-07 Issue:7 Volume:71 Page:3508-3512
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Song Tai¹^ORCID,Huang Zhengfeng²^ORCID,Zhang Li¹^ORCID,Hong Qi¹,Yang Zhao²^ORCID,Krstic Milos³^ORCID

Affiliation:

1. School of Integrated Circuits, Anhui University, Hefei, Anhui, China

2. School of Microelectronics, Hefei University of Technology, Hefei, Anhui, China

3. System Architectures, IHP - Leibniz-Institut fur innovative Mikroelektronik, Frankfurt (Oder), Germany

Funder

China Scholarship Council through the CSC

Cooperative Education Project of the Ministry of Education

National Natural Science Foundation of China

Major Science and Technology Projects of Anhui Province

Key Research and Development Projects in Anhui Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/8920/10581876/10423303.pdf?arnumber=10423303

Reference24 articles.

1. Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation

2. RLDA: Valid test pattern identification by machine learning classification method for VLSI test

3. How Many Test Patterns are Useless?

4. 2012 Updates to the international technology roadmap for semiconductors (ITRS);Hacker;Metrol. Chapter,2013

5. Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

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