Power-Efficient Noise-Induced Reduction of ReRAM Cell’s Temporal Variability Effects-Reference-Cited by-同舟云学术

Power-Efficient Noise-Induced Reduction of ReRAM Cell’s Temporal Variability Effects

Published:2021-04 Issue:4 Volume:68 Page:1378-1382
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Ntinas Vasileios,Rubio Antonio,Sirakoulis Georgios Ch.,Aguilera Emili Salvador,Pedro Marta,Crespo-Yepes Albert,Martin-Martinez Javier,Rodriguez Rosana,Nafria Montserrat

Funder

Spanish MINECO

Project FPI-UPC

Greece–Russia Bilateral Joint Research Project MEM-Q through GSRT

National and European Funds

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8920/9387428/09205867.pdf?arnumber=9205867

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